Understanding Robust and Exploratory Data Analysis

David C. Hoaglin & Frederick Mosteller & John W. Tukey & John Wiley & Sons

Language: English

Publisher: Wiley

Published: Aug 15, 1983

Description:

Stem-and-leaf displays; Letter values: a set of selected order statistics; boxplots and batch comparison; Transforming data; Resistant lines for versus; Analysis of two-way tables by medians; Examining residuals; Mathematical aspects of transformation; Introduction to more refined estimators; Comparing location estimators: trimmed means, medians, and trimean; M-estimators of location: an outline of the theory; Robust scale estimators and confidence intervals for location.